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Probabilistic Delay Fault Model for DVFS Circuits
  • ISSN号:0372-2112
  • 期刊名称:《电子学报》
  • 时间:0
  • 分类:TP302.8[自动化与计算机技术—计算机系统结构;自动化与计算机技术—计算机科学与技术] TN432[电子电信—微电子学与固体电子学]
  • 作者机构:[1]Institute of Microelectronics, Tsinghua University, Beijing 100084, China, [2]Department of Electronic Engineering, Universitat Politecnica de Catalunya, Barcelona 08020, Spain
  • 相关基金:Supported in part by the National Natural Science Foundation of China (No. 60236020) and the MCyT and FEDER Projects TEC2010
中文摘要:

Decreasing the power supply voltage in dynamic voltage frequency scaling to save power consumption may introduce extra delays in CMOS circuits, which may cause errors. This paper presents the probabilistic delay fault model (PDFM), which describes the probability of an error occurring as a function of the power supply voltage and the clock period in synchronous CMOS circuits. In a wide range of applications (graphic, video, digital filtering, etc.), errors occurring with low probability and not remaining for a long time are acceptable. For combinational circuits which have long critical paths with low probability of excitation, a performance increase is achieved with a certain rate of errors determined by the PDFM compared with the traditional design which considers the worst case. The PDFM applied to array multipliers and ripple carry adders shows the agreement of the predicted probabilities with simulated delay histograms to support the practicality of using the PDFM to select power supply voltage and clock period in dynamic voltage frequency scaling circuits with tolerable error rates.

英文摘要:

Decreasing the power supply voltage in dynamic voltage frequency scaling to save power con- sumption may introduce extra delays in CMOS circuits, which may cause errors. This paper presents the probabilistic delay fault model (PDFM), which describes the probability of an error occurring as a function of the power supply voltage and the clock period in synchronous CMOS circuits. In a wide range of applica- tions (graphic, video, digital filtering, etc.), errors occurring with low probability and not remaining for a long time are acceptable. For combinational circuits which have long critical paths with low probability of excita- tion, a performance increase is achieved with a certain rate of errors determined by the PDFM compared with the traditional design which considers the worst case. The PDFM applied to array multipliers and ripple carry adders shows the agreement of the predicted probabilities with simulated delay histograms to support the practicality of using the PDFM to select power supply voltage and clock period in dynamic voltage fre- quency scaling circuits with tolerable error rates.

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期刊信息
  • 《电子学报》
  • 中国科技核心期刊
  • 主管单位:中国科学技术协会
  • 主办单位:中国电子学会
  • 主编:郝跃
  • 地址:北京165信箱
  • 邮编:100036
  • 邮箱:new@ejournal.org.cn
  • 电话:010-68279116 68285082
  • 国际标准刊号:ISSN:0372-2112
  • 国内统一刊号:ISSN:11-2087/TN
  • 邮发代号:2-891
  • 获奖情况:
  • 2000年获国家期刊奖,2000年获国家自然科学基金志项基金支持,中国期刊方阵“双高”期刊
  • 国内外数据库收录:
  • 美国化学文摘(网络版),荷兰文摘与引文数据库,美国工程索引,美国剑桥科学文摘,日本日本科学技术振兴机构数据库,中国中国科技核心期刊,中国北大核心期刊(2004版),中国北大核心期刊(2008版),中国北大核心期刊(2011版),中国北大核心期刊(2014版),英国英国皇家化学学会文摘,中国北大核心期刊(2000版)
  • 被引量:57611