根据自由基发光理论.本文用MPL-A多参数化学发光分析系统测得了由Mn^+3引发的淀粉自由基发光强度的变化曲线。阐述了自由基发光强度的变化规律;并通过对发光曲线的拟合发现:自由基的消失过程遵循logistic公式。通过分析得出x0即为自由基的半衰期,A1为x→0时样品的发光强度.A2表示x→+∞时样品的发光强度,P为发光样品中影响自由基消失因素的系数表示。本研究是光电检测技术在淀粉工业中的新的应用,为淀粉自由基消失规律提供了数学模型。
According to the theory that starch free radicals can produce light when they are initiated by Mn^+3 , the light intensity curve is measured with MPL-A, and the law of light intensity is explained in this paper. Throngh fitting the curve,it is found that the disappearance of starch free radicals follows the logistic formula. By analysing the experimental result,the paper defines that the x0 is the half life,the A1 is the light intensity when x→ 0,the A2 is the light intensity when x→+ ∞, and the P is the coefficient that responses the disappearance of the free radicals all of which offer a mathematic model for the disappearance of starch free radicals.