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Suppression of bias stress-induced degradation of pentacene-TFT using MoOx
  • ISSN号：1567-1739
  • 期刊名称：Current Applied Physics
  • 时间：2012.6.6
  • 页码：280-283
  • 相关项目：微晶硅TFT-OLED的若干基础问题的研究
作者： Jun Li|Hua-Ping Lin|Fang Zhou|Wen-Qing Zhu|Xue-Yin Jiang|Zhi-Lin Zhang|
同期刊论文项目
微晶硅TFT-OLED的若干基础问题的研究
期刊论文 23 专利 1
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