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A new method to determine parastic capacitances for HEMTs
  • ISSN号：0895-2477
  • 期刊名称：Microwave and Optical Technology Letters
  • 时间：2013.6.1
  • 页码：3005-3007
  • 相关项目：高电子迁移率晶体管毫米波建模和可靠性研究
作者： 沈溧|高建军|
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高电子迁移率晶体管毫米波建模和可靠性研究
期刊论文 28 会议论文 5 著作 1
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