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Effect of Guard-Ring on the DC and High-Frequency Performance of Deep-Submicrometer Metal Oxide Semi
  • ISSN号：1096-4290
  • 期刊名称：International Journal of RF and Microwave Computer
  • 时间：2014.2.1
  • 页码：259-267
  • 相关项目：高电子迁移率晶体管毫米波建模和可靠性研究
作者： L.Sun|J. Gao|A. Werthof|
同期刊论文项目
高电子迁移率晶体管毫米波建模和可靠性研究
期刊论文 28 会议论文 5 著作 1
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