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Characterization of microvoids in thin hydrogenated amorphous silicon layers by spectroscopic ellips
  • ISSN号：1359-6462
  • 期刊名称：Scripta Materialia
  • 时间：2015.6.3
  • 页码：50-53
  • 相关项目：基于异质结晶体硅太阳电池的a-SiOx:H薄膜生长和钝化机理研究
作者： Jian Bao|JInning Liu|Dongliang Wang|Zhengxin Liu|
同期刊论文项目
基于异质结晶体硅太阳电池的a-SiOx:H薄膜生长和钝化机理研究
期刊论文 10 会议论文 5
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