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Defect study of as-grown single crystal ZnO by positron
  • ISSN号：0255-5476
  • 期刊名称：Materials Science Forum
  • 时间：0
  • 页码：143-145
  • 语言：英文
  • 相关项目：用高分辨数字式正电子寿命谱研究AlN、ZnO等半导体中的缺陷
作者： Wang Zhu|Li Hui|Ke Junyu|Pang Jinbiao|Dai Yiqun|Zhao Youwen|
同期刊论文项目
用高分辨数字式正电子寿命谱研究AlN、ZnO等半导体中的缺陷
期刊论文 13 会议论文 2
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