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Identification of vacancies in electron irradiated GaSb by coincidence Doppler broadening spectrosco
  • ISSN号：0167-577X
  • 期刊名称：Materials Letters
  • 时间：0
  • 页码：1187-1189
  • 语言：英文
  • 相关项目：用高分辨数字式正电子寿命谱研究AlN、ZnO等半导体中的缺陷
作者： Dai, Y. Q.|Shao, Y. D.|Tang, F. Y.|Zhao, Y. W.|Wang, Z.|
同期刊论文项目
用高分辨数字式正电子寿命谱研究AlN、ZnO等半导体中的缺陷
期刊论文 13 会议论文 2
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