位置：成果数据库 > 期刊 > 期刊详情页
Study of the thickness effect on the dielectric functions by utilizing a wedge-shaped Ti film sample
  • ISSN号：0947-8396
  • 期刊名称：Applied Physics A-Materials Science & Processi
  • 时间：2015.9
  • 页码：875-879
  • 相关项目：尺寸可控硅纳米晶的光学性质研究
作者： Wang Song-You|Wei Yan-Feng|Huang Ren-Zhong|Chen Liang-Yao|
同期刊论文项目
尺寸可控硅纳米晶的光学性质研究
期刊论文 35
同项目期刊论文
Contribution of thickness dependent void fraction and TiSixOy interlayer to the optical properties o
Double layers of H-2 adsorption on an AlN sheet induced by electric field
唯一性检测在椭圆偏振光谱薄膜拟合中的应用（英文）
The thickness-dependent band gap and defect features of ultrathin ZrO2 films studied by spectroscopi
Broadband optical absorption by tunable Mie resonances in silicon nanocone arrays
The impact of thickness and thermal annealing on refractive index for aluminum oxide thin films depo
Optical properties of epitaxial BiFeO3 thin film grown on SrRuO3-buffered SrTiO3 substrate
Temperature dependent optical properties of Si nanocrystals embedded in SiO2 matrix
Thickness dependent optical properties of titanium oxide thin films
Y分支平面波导型光分路器的研制
AFM扫描参数对样品粗糙度测量的影响
Optical properties of epitaxial BiFeO3 thin filmgrown on SrRuO3-buffered SrTiO3 substrate
Manipulating a Co adatom on a stepped Cu surface by an STM tip:A theoretical study
Temperature dependent optical properties of Si nanocrystalsembedded in SiO2 matrix
Evolution of optical properties of tin film from solid to liquid studied by spectroscopicellipsometr
Temperature-Dependent Optical Properties of Titanium Oxide Thin Films Studied by Spectroscopic Ellip
Optical constants and band gap expansion of size controlled silicon nanocrystals embedded in SiO2 ma
二维折叠光谱分析研究
碲镉汞红外探测器增透结构设计
唯一性检测在椭圆偏振光谱薄膜拟合中的应用