使用高能电子辐照对GaN基蓝光发光二极管(Light Emitting Diode,LED)光电学性能的影响进行研究。高能电子束流分别对不同组别的LED样品进行辐照实验,并通过自动测控系统对辐照过程中LED的电流、光强、光谱峰值波长进行全程测控。随后,在室温无辐照环境下对上述不同组别的LED样品进行跟踪对比测试研究。实验结果表明,高能辐照对LED的改性有明显效果,具体表现在工作电流和发光功率变化时受辐照影响的稳定性有所改善,光谱峰值波长出现蓝移。同时,GaN基LED在辐照过程中是否通电对LED的光电学性能有显著影响。
Background: The performance of GaN-based light emitting diode (LED) will be affected by the gamma, neutron and electron radiation. Purpose: To study the impact of high-energy electron radiation on photoelectric properties of GaN-based LED, samples were setup in the beam line for electron radiation. Methods: The current, light power and emission wavelength of the irradiating LED were monitored by an automatic monitoring and control system during the beam time. And the aging tests of these LED samples were also finished. Results: The current, the light power stability of each sample were varied with different electron radiation. Also luminescence wavelength of some samples has a certain blue shift phenomenon. Conclusion: High-energy radiation has obvious effect on thephotoelectric properties of the GaN-based LED.