位置：成果数据库 > 会议 > 会议详情页
Interconnect Capacitance Characterization based on Charge Based Capacitance Measurement (CBCM) Techn
  • 所属机构名称：北京大学
  • 会议名称：9th International Conference on Solid-State and Integrated-Circuit Technology
  • 成果类型：会议
  • 会场：Beijing, PEOPLES R CHINA
  • 相关项目：纳米工艺下可制造性和成品率驱动的集成电路设计方法学研究
作者： Tang, Haixia|Zhang, Yonghong|Cheng, Yuhua|Gao, Panpan|
同会议论文项目
纳米工艺下可制造性和成品率驱动的集成电路设计方法学研究
期刊论文 14 会议论文 37 专利 10
同项目会议论文
A High Quality CMOS Power Regulator for a Wireless Endoscope
A Physical-Based Mobility Model Including STI Stress MOSFETs
RDF Effect Induced by Source/Drain Doping in Nano-Scale UTB SOI MOSFET with Nominally Un-doped Chann
Design of wide power supply, high performance voltage regulator with BCD process
Source/Drain Doping Induced Vth Variation in Nano-scale UTB SOI MOSFET
Site-Site Wireless Power Transmission for Medical Endoscopes
An Overview of Process/Device Modeling Efforts for DFM in advanced CMOS Technology
A Study of Advanced Modeling Methodology of CMOS-compatible RF-MEMS Devices for Integrated Circuit D
Characterization and Analysis of Pattern Dependent Variation-aware Interconnects for a 65nm Technolo
An Efficient wireless power Transmission System for the Capsule Endoscopy Application
A Study of a10-bit 50MS/s Low Voltage Low Power Pipelined ADC
A Charge Pump Circuit Design Based on a 0.35um BCD Technology for High Voltage Driver Applications
Equalization Techniques for High-speed Serial Interconnect Transceivers
A Novel Super-Halo Doping Concept for Nanoscale CMOS Technology
Design For Manufacturing (DFM) in Nano-CMOS Era
Impact of stochastic mismatch on FinFETs SRAM cell induced by process variation
Influence of contact positioning on the performance of stress induced MOSFETs
3-D simulation of geometrical variations impact on nanoscaleFinFETs
A Simple Nano-Scale Patterning Technology for FinFET Fabrication
Variability in Nano-Scale Intrinsic Silicon-on-Thin-Box MOSFETs (SOTB MOSFETs)
Modeling of Variability in Geometric Parameters of MOSFETs for DFM Applications
110W High Power LED Street Lamp Power Driver
Variability in Variable-Body-Factor Silicon-on-Thin-Box MOSFETs (SOTB MOSFETs)
Development of a MEMS/IC Design Environment for RFIC applications
Analysis and Optimization of High-Voltage Devices in a BCD Process
Wafer-Area-Saving Test Structures and Measurement Method for The Characterization of Interconnect Re
Variability Induced by Line Edge Roughness in Intrinsic Silicon-on-Thin-Box (SOTB) MOSFETs
Design and Optimization of Power Devices in a BCD Process
Characteristic Variations Induced by Random Fluctuation of Source/Drain Lateral Distribution Dopant
A 10-bit 1.2V high speed current-steering DAC using a novel switching scheme
VLSI Implementation of Color Interpolation in Color Difference Spaces
A 6-bit 2GS/s 1.2V 78mW Flash ADC in 65nm CMOS
An Efficient and Staible Power Management Cricuit with High Output Energy for wireless powering Caps
Analysis and architecture design of block matching in BM3D image denoising
High-speed Serial Interconnect Transceiver: Applications and Design
Full 3-D simulation of gate line edge roughness impact on sub-30 nm FinFETs