欢迎您!
东篱公司
退出
申报数据库
申报指南
立项数据库
成果数据库
期刊论文
会议论文
著 作
专 利
项目获奖数据库
位置:
成果数据库
>
会议
> 会议详情页
Study on the Crack Propagation Mechanism of Packaging Polymers by a Combinational Approach of Fractu
所属机构名称:桂林电子科技大学
会议名称:Proceedings of International Conference on Fracture and Damage of Advanced Materials,
语言:英文
成果类型:会议
相关项目:微电子封装用高聚物的热-机械疲劳损伤研究
作者:
Y.B. Gong|Q.Y. Li|D.G. Yang|S. Wu (龚雨兵|李泉永|杨道国|梁军生)|
同会议论文项目
微电子封装用高聚物的热-机械疲劳损伤研究
期刊论文 14
会议论文 12
同项目会议论文
Optimal Structural Parameters for Flip Chip Assembly Based on Minimum Residual Stress Induced in Maj
A New Educational Curriculum for Microelectronic Manufacturing Engineering Program
Thermal-Mechanical Stress and Fatigue Failure Analysis of A PBGA
Study on Simulation-based Optimization for Flip Chip Package Parameters by Using RSM Analysis and An
Finite Element Analysis of Hygro-thermal Induced Failure in Plastic Packages
Multi-level Education Curriculum of Electronic Manufacturing Engineering in GUET
Analysis of thermal-moisture induced failure of Pb-free soldered IC packages in SMT reflow soldering
用概率设计方法对无铅倒装焊封装芯片的参数研究
A Study on The Creep Damage of Epoxy Molding Compound in IC Package
Parametric analysis and optimization for Flip Chip package
Warpage-Based Optimization Of The Curing Profile For Electronic Packaging Polymers