通过化学溶液沉积法在氧化铟锡(ITO)/导电玻璃上生长了BiFeO,多晶薄膜.利用x射线衍射仪(XRD)、扫描电子显微镜(SEM)、X射线光电子能谱分析仪(XPS)、磁性测量系统(MPMS)和铁电测试仪对样品的结构、形貌、元素价态、铁磁性和铁电性进行研究.结果表明,薄膜为自取向生长,具有良好的[101]生长取向和平整的表面.室温下,样品呈铁磁性,沿样品取向方向为易磁化轴方向.铁电测试结果表明,其饱和电极化强度达到51.3℃/cm2.
BiFeO3 (BFO) film was grown on ITO/gtass substrate Dy cnemt Structure, surface morphology, valence, magnetic property and ferroelectricity of the BFO film were investiga- ted by X-ray diffractometer, scanning electron microscope, X-ray photoelectron spectroscopy, magnetic prop erty measurement system and ferroelectric tester. The results showed that the film growed along [ 101 ] crystal orientation and had a plat and smooth surface. The films presented ferromagnetic behavior, the magnetization easy axis is along [ 101 ]. The saturation polarization was about 51.3 ixC/cm2.