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中文摘要：
为有效提高嵌入式静态随机访问存储器（Static Random Access Memory,SRAM）的可靠性,进而确保整个航天电子系统的可靠运行,通过对嵌入式SRAM故障分布特点的分析,给出了一种改进的存储器架构。采用列块修复与行单元修复相配合的方法,并在此基础上提出了二维冗余模块存在故障的内建冗余分析（Built-In Re-dundancy Analysis,BIRA）策略。该策略高效运用了设置的行修复寄存器与列修复寄存器,极大地提高了故障的修复率。通过64×8位的SRAM仿真实验验证了提出的内建冗余分析策略的可行性,有效确保了系统在冗余模块和主存储器都存在故障的情况下的高可靠运行。
英文摘要：
In order to effectively improve the reliability of embedded SRAM,thus ensuring the reliable operation of entire aerospace electronic systems,through analysis of the characteristics of the distribution of faults of embedded SRAM,a method of column block repair and row unit repair is used on the basis of the improved memory architecture,and a built-in redundancy analysis（BIRA） strategy with faults in a 2-D redundancy module is proposed.This strategy uses the row repair register and column repair register effectively,and the fault repair rate is greatly improved.The simulation experiments for the 64 × 8-bit SRAM proved the feasibility of BIRA,which ensures reliable operation of the system in the presence of faults of main memory and spare modules.
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