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Microstructure, magnetoelectric properties and leakage mechanisms of La0.7Ca0.3MnO3/Bi3.15Nd0.85Ti3O
  • ISSN号：ISSN-:12932558
  • 期刊名称：Solid State Sciences
  • 时间：2013
  • 页码：35-39
  • 相关项目：FeCMOS基本门电路辐照效应及机理研究
作者： H. Q. Cai|C. P. Cheng|L. Q. Li|Y. C. Zhou|
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