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Characterization of Changes in LDO Susceptibility after Electrical Stress
ISSN号:0018-9375
期刊名称:IEEE Transactions on Electromagnetic Compatibility
时间:2013.10.10
页码:883-890
相关项目:FeCMOS基本门电路辐照效应及机理研究
作者:
J. Wu*, A. Boyer, J. Li, S. B. Dhia, R. Shen.|
同期刊论文项目
FeCMOS基本门电路辐照效应及机理研究
期刊论文 43
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