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中文摘要：
本文采用专家调查方法来测度产业创新能力的国际差距。我们通过锚点校准法,提高了专家调查方法的结果的可靠性。将该方法运用到中美两国的集成电路设计产业中,了解专家群体对该产业创新产出和创新能力的主观判断,从而测量中美两国之间集成电路设计产业创新能力的差距。调查结果表明,中美两国的集成电路设计产业技术能力相差约40个月。研究还对两国的创新环境和创新政策进行了比较。总之,基于专家调查的创新能力评测为传统的创新测量提供了一个有益的补充。
英文摘要：
This paper measures the international gap of industrial innovation capacity through expert survey method. By selecting proper samples and anchoring vignettes,we improve the reliability of the expert survey results. Then,we apply the expert survey method in the IC design industry in China and the US. The survey provides subjective opinions of expert groups on the industrial innovation output and capacity. It also concludes that the gap of IC industrial innovation capacity between China and the US is 40 months at that time. By comparing the innovation environment in China and the US,policy implications are drawn from the survey. The expert survey method offers a complementary view to the traditional method of innovation capacity measurement.
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