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含有限晶粒的微小接头的拉伸变形行为研究
  • ISSN号:1001-3474
  • 期刊名称:电子工艺技术
  • 时间:0
  • 页码:311-314
  • 语言:中文
  • 分类:TG1[金属学及工艺—金属学]
  • 作者机构:[1]Department of Electronics Packaging Technology, School of Materials Science and Engineering, Harbin Institute of Technology, Harbin 150001, China
  • 相关基金:Project(50675047) supported by the National Natural Science Foundation of China
  • 相关项目:含有限晶粒的电子封装微连接接头的微观力学行为
中文摘要:

制止 AuSnx 金属间化合的部件(IMC ) 的形成在焊接关节, Zn 被增加进 Sn 富有焊接。solder 关节被激光制作回流焊接方法,然后他们在 125 点被变老 ???  ?? ????? 湓 ?????? 娠 ???? D

英文摘要:

To restrain the formation of AuSnx intermetallic components (IMCs) in solder joints, Zn was added into Sn-rich solders. The solder joints were fabricated by a laser reflow soldering method, and then they were aged at 125 ℃. The results show that the total thickness of AuSnx IMCs at the interface of pure Sn solder and Au foils reaches about 54 μm under the condition of 600 h aging. In Sn-1.5Zn solder joints, however, formation of AuSn4 IMCs is restrained greatly. As the content of Zn in the solder is increased to 3.5%(mass fraction), no AuSn4 IMC is observed at the interface. Au-Zn phases form beside AuSn2 and AuSn IMCs layers. As for Sn-9.0Zn solder joints, Au-Zn and Au-Zn-Sn phases and few AuSnx IMCs form at the interface. Moreover, total thickness of the phases and IMCs is far less than that ofAuSnx IMCs in the pure Sn solder joints.

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期刊信息
  • 《电子工艺技术》
  • 主管单位:信息产业部
  • 主办单位:中国电子科技集团公司第二研究所 中国电子学会
  • 主编:吕淑珍
  • 地址:太原市和平南路115号
  • 邮编:030024
  • 邮箱:bjb3813@126.com
  • 电话:0351-6523813
  • 国际标准刊号:ISSN:1001-3474
  • 国内统一刊号:ISSN:14-1136/TN
  • 邮发代号:22-52
  • 获奖情况:
  • 信息产业部优秀科技期刊奖,山西省一级期刊
  • 国内外数据库收录:
  • 被引量:4162