大气等离子体加工反应过程中,等离子体发生装置的热稳定过程对去除率有直接影响,CF4是化学反应中活性F^*原子的提供者,O2是重要的辅助气体。为了寻找这三者对大气等离子体加工反应过程的影响规律,采用大气等离子体加工系统进行加工、光谱仪监控等离子体反应过程的活性F^*原子的光谱变化。实验结果表明,在大气压等离子体加工系统中:热稳定后,活性F^*原子强度基本不随时间变化;随着CF4含量的增加,F^*原子谱线轮廓发生了自吸收现象,这说明采用光谱法研究CF4含量对活性F^*原子含量的影响是不完全准确的;由于O2易和CF4解离的中间产物反应,抑制活性粒子重新组合,因此一定范围内随着02含量增加,活性F^*原子增加。
In the reaction of the atmospheric pressure plasma process, the heat stable process of the atmospheric pressure plasma jet has a direct impact on the removal rate, CF4 is the provider of active F^* atom, O2 is important auxiliary gas, and they play an important role in the process. In order to research the rule of the concentration of the 3 parameters upon the atmospheric pres-sure plasma processing, the atmospheric pressure plasma jet was used for processing and the spectrometer was used to monitor the changes in the process. The experiment indicates that: when the heat is stable, the concentration of the active F^* atom essemially remains unchanged; with increasing the concentration of gas CF^*, the spectrum of the active F^* atom has self-absorp- tion phenomena, so using the atomic emission spectroscopy method to monitor the changes in the concentration of active F^* atom generated by CF4 is not completely exact; because O2 can easily react with the dissociation product of CF4, which inhibits the compound of the active F^* atom, so in a certain range with increasing the concentration of gas O2, the concentration of the active F^* atom becomes strong.