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An area-efficient LDMOS-SCR ESD protection device for the I/O of power IC application
  • ISSN号：0026-2714
  • 期刊名称：Microelectronics Reliability
  • 时间：2014.7
  • 页码：1173-1178
  • 相关项目：基于FBAR的紫外和红外光传感器的研究
作者： Han, Yan|Liu, Weicheng|Li, Hongwei|Wang, Jun|
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基于FBAR的紫外和红外光传感器的研究
期刊论文 36 会议论文 1
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