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A novel power-clamp assisted complementary MOSFET for robust ESD protection
  • ISSN号：0026-2714
  • 期刊名称：Microelectronics Reliability
  • 时间：2012
  • 页码：1593-1597
  • 相关项目：基于FBAR的紫外和红外光传感器的研究
作者： Meng Miao|Fei Ma|Jianfeng Zheng|Yan Han|
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基于FBAR的紫外和红外光传感器的研究
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