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Influence of edge effects on single event upset susceptibility of SOI SRAMs
  • ISSN号：0168-583X
  • 期刊名称：Nuclear Instruments and Methods in Physics Researc
  • 时间：2015.1.1
  • 页码：286-291
  • 相关项目：地面模拟空间辐射环境下的技术方法及单粒子效应研究
作者： Mingdong Hou|Gang Liu|Tianqi Liu|Kai Xi|
同期刊论文项目
地面模拟空间辐射环境下的技术方法及单粒子效应研究
期刊论文 56 会议论文 3
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