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GaSb Metal-Oxide-Semiconductor Capacitors with Atomic-Layer-Deposited HfAlO as Gate Dielectric
ISSN号:1099-0062
期刊名称:Electrochemical and Solid-State Letters
时间:2012
页码:51-54
相关项目:分子层淀积量子阱有机薄膜晶体管的基础研究
作者:
Xu, Min|Gu, Jiangjiang|Zhang, David Wei|Ye, Peide D.|
同期刊论文项目
分子层淀积量子阱有机薄膜晶体管的基础研究
期刊论文 47
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