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Dislocation-mediated coupling mechanism between the microstructural defects and Te inclusions in CdZ
  • ISSN号：1359-6462
  • 期刊名称：Scripta Materialia
  • 时间：2014.7.1
  • 页码：17-20
  • 相关项目：II-VI族Te化物半导体中富Te相及其诱导缺陷的调控研究
作者： Zhou, Yan|Liu, Huimin|Wang, Tao|Zha, Gangqiang|
同期刊论文项目
II-VI族Te化物半导体中富Te相及其诱导缺陷的调控研究
期刊论文 36
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