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Soft error reliability in advanced CMOS techn
  • ISSN号：1674-7321
  • 期刊名称：Science China Technological Sciences
  • 时间：2014.9.1
  • 页码：1846-1857
  • 相关项目：超深亚微米SOI器件的重离子单粒子效应新机理研究
作者： LI YongHong|ZANG Hang|XIONG Cen|ZHANG JinXin|
同期刊论文项目
超深亚微米SOI器件的重离子单粒子效应新机理研究
期刊论文 16 会议论文 1
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不同偏置影响锗硅异质结双极晶体管单粒子效应的三维数值仿真研究
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