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Radiation hardened by design techniques to reduce single event transient pulse width based on the ph
  • ISSN号：0026-2714
  • 期刊名称：Microelectronics Reliability
  • 时间：2012
  • 页码：1227-1232
  • 相关项目：吉赫兹锁相环单粒子瞬变效应建模与加固技术研究
作者： Chen, Jianjun1|Chen, Shuming1|Liang, Bin1|Liu, Biwei1|Liu, Fanyu1|
同期刊论文项目
吉赫兹锁相环单粒子瞬变效应建模与加固技术研究
期刊论文 28 会议论文 19 专利 1
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