采用分子束外延的方法在BaF2(111)衬底上制备出了高质量的Pb1-xMnxSe(0≤x≤0.0681)薄膜,X射线衍射结果表明,Pb1-xMnxSe薄膜为立方相NaCl型结构,没有观察到MnSe相分离现象,薄膜的取向为平行于衬底(111)晶面,晶格常数随着Mn含量的增加逐渐减小,Mn含量由Vegard公式得到.通过理论模拟Pb1-xMnxSe薄膜的透射光谱,得到了Pb1-xMnxSe薄膜的带隙与Mn组分的关系Pb1-xMnxSe薄膜的带隙宽度由0.28eV(x=0)按e指数形式增加到0.49ev(x=0.0681),同时还获得了Pb1-xMnxSe薄膜在波长为4-9.5μm间的折射率。
High quality Pb1-xMnxSe(0≤x≤ 0.0681 ) thin films have been grown on BaF2 (111) substrates by molecular beam epitaxy. Optical and structural properties of the Pb1-xMnxSe films have been studied using transmission spectrum and high resolution X-ray diffraction(HRXRD). HRXRD patems indicate that Pb1-xMnxSe films have cubic-phase structure, and MnSe phase separation is not observed. The film orientation is parallel to (111 ) surface of substrate. The lattice constant of Pb1-xMnxSe films decreases with increasing Mn content. The Mn content can be obtained by using Vegard' s formula. Sharp absorption edges were observed in the transmission spectrum of Pb1-xMnxSe films. The fundamantal band gap of the Pb1-xMnxSe films was obtained by simulation, which increases almost exponentially from 0.28 eV at x = 0 to 0.49 eV at x = 0.0681. The refractive index in the wavelength ranged from 4 to 9.5μm has also been obtained.