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Investigation on Interface Related Charge Trapping Capability in Bandgap Engineering High-k Based Ch
  • 所属机构名称：中国科学院微电子研究所
  • 会议名称：2012 Materials Research Society Spring Meeting
  • 时间：2012.4.9
  • 成果类型：会议
  • 相关项目：面向三维集成的纳米尺度电荷陷阱存储器机理与可靠性研究
作者： Dongxia Shi|Guangyu Zhang|Fanghua Li|Ming Liu|
同会议论文项目
面向三维集成的纳米尺度电荷陷阱存储器机理与可靠性研究
期刊论文 24 会议论文 15
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