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High performance MAHAHOS memory devices: Charge trapping and distribution in bandgap engineered stru
  • 所属机构名称：中国科学院微电子研究所
  • 会议名称：2012 4th IEEE International Memory Workshop, IMW 2012
  • 时间：2012
  • 成果类型：会议
  • 相关项目：面向三维集成的纳米尺度电荷陷阱存储器机理与可靠性研究
作者： Liu, Jing1|Zhang, Guangyu2|Li, Fanghua2|Liu, Ming1|
同会议论文项目
面向三维集成的纳米尺度电荷陷阱存储器机理与可靠性研究
期刊论文 24 会议论文 15
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