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On reducing both shift and capture power for scan-based testing
  • 所属机构名称：中国科学院计算技术研究所
  • 会议名称：Asia and South Pacific Design Automation Conference
  • 成果类型：会议
  • 会场：Seoul, SOUTH KOREA
  • 相关项目：避免过度测试的时延测试生成方法
作者： Li, Jia|Hu, Yu|Xu, Qiang|Li, Xiaowei|
同会议论文项目
避免过度测试的时延测试生成方法
期刊论文 28 会议论文 18 专利 4
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