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Flip-flop Selection for Transition Test Pattern Reduction Using Partial Enhanced Scan
  • 所属机构名称：中国科学院计算技术研究所
  • 会议名称：15th IEEE Pacific Rim International Symposium on Dependable Computing
  • 成果类型：会议
  • 会场：Shanghai, China
  • 相关项目：避免过度测试的时延测试生成方法
作者： Xiaowei Li|Huawei Li|Songwei Pei|
同会议论文项目
避免过度测试的时延测试生成方法
期刊论文 28 会议论文 18 专利 4
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