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MicroFix: Exploiting Path-grained Timing Adaptability for Improving Power-Performance Efficiency
  • 所属机构名称：中国科学院计算技术研究所
  • 会议名称：IEEE/ACM International Symposium on Low Power Electronics and Design 2009
  • 成果类型：会议
  • 相关项目：避免过度测试的时延测试生成方法
作者： Yinhe Han|Hui Liu|Xiaoyao Liang|Xiaowei Li|Guihai Yan|
同会议论文项目
避免过度测试的时延测试生成方法
期刊论文 28 会议论文 18 专利 4
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