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On selection of testable paths with specified lengths for faster-than-at-speed testing
  • 所属机构名称：中国科学院计算技术研究所
  • 会议名称：2010 19th IEEE Asian Test Symposium, ATS 2010
  • 成果类型：会议
  • 会场：Shanghai, China
  • 相关项目：避免过度测试的时延测试生成方法
作者： Xiang Fu|Xiaowei Li|Huawei Li|
同会议论文项目
避免过度测试的时延测试生成方法
期刊论文 28 会议论文 18 专利 4
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