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Graph partition based path selection for testing of small delay defects
  • 所属机构名称：中国科学院计算技术研究所
  • 会议名称：2010 15th Asia and South Pacific Design Automation Conference, ASP-DAC 2010
  • 成果类型：会议
  • 会场：Taipei, Taiwan
  • 相关项目：避免过度测试的时延测试生成方法
作者： Li, Xiaowei|Lv, Tao|He, Zijian|Li, Huawei|
同会议论文项目
避免过度测试的时延测试生成方法
期刊论文 28 会议论文 18 专利 4
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