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A scan-based delay test method for reduction of overtesting
  • 所属机构名称：中国科学院计算技术研究所
  • 会议名称：4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008
  • 成果类型：会议
  • 会场：Hong Kong, SAR, Hong kong
  • 相关项目：避免过度测试的时延测试生成方法
作者： Hui, Yu|Li, Xiaowei|Li, Huawel|Liu, Hui|
同会议论文项目
避免过度测试的时延测试生成方法
期刊论文 28 会议论文 18 专利 4
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