Inhibition of Electromigration in Eutectic SnBi Solder Interconnect by Plastic Prestraining
- ISSN号:1005-0302
- 期刊名称:Journal of Materials Science & Technology
- 时间:2011.11
- 页码:1072-1076
- 分类:TB[一般工业技术]
- 作者机构:[1]Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences Shenyang 110016, China, [2]Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign. Urbana. IL 61801. USA
- 相关基金:This work was supported by the National Natural Science Foundation of China (Grant No. 51171191), the National Basic Research Program of China (Grant No. 2010CB631006) and the Natural Science Foundation of Liaoning Province, China (Grant No. 20092076). The authors would like to thank H.Y. Guo for helpfifl discussion.
- 相关项目:Sn基无铅焊料电迁移的各向异性研究
中文摘要:
Corresponding author. Prof., Ph.D.; Tel./Fax: +86 24 23971703; E-mail address: jkshang@imr.ac.cn