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Prediction model of lifetime for copper pillar bumps under coupling effects of current and thermal c
ISSN号:0957-4522
期刊名称:Journal of Materials Science-Materials in Electron
时间:2016.2
页码:1184-1190
相关项目:Sn基无铅焊料电迁移的各向异性研究
作者:
Zhu, Qingsheng|Shang, Jianku|Zhang, Li|Guo, Hongyan|
同期刊论文项目
Sn基无铅焊料电迁移的各向异性研究
期刊论文 12
会议论文 2
同项目期刊论文
Dependence of electromigration damage on Sn grain orientation in Sn-Ag-Cu solder joints
Electroless Deposition of Highly Solderable Fe-Ni Films
Application of Electroless Fe-42Ni(P) Film for Under-bump Metallization on Solder Joint
Inhibition of Electromigration in Eutectic SnBi Solder Interconnect by Plastic Prestraining
Copper Bottom-up Filling for Through Silicon Via (TSV) Using Single JGB Additive
Phase identification on the intermetallic compound formed between eutectic SnIn solder and single cr
Phase transformation between Cu(In,Sn)(2) and Cu-2(In,Sn) compounds formed on single crystalline Cu
Reliability and failure mechanism of copper pillar joints under current stressing
Magnetic-field induced anisotropy in electromigration behavior of Sn-Ag-Cu solder interconnects
Thermal Performance of Low-Melting-Temperature Alloy Thermal Interface Materials
Microstructure evolution in metals induced by high density electric current pulses