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The effect of oxygen ion beam bombardment on the properties of tin indium oxide/polyethylene terepht
  • ISSN号：0040-6090
  • 期刊名称：Thin Solid Films
  • 时间：2013.10.31
  • 页码：365-370
  • 相关项目：a-SiOxNy薄膜化学键结构与缺陷形成机理的研究
作者： Li Li|Honglin Liu|丁万昱|Dongying Ju|Weiping Chai|
同期刊论文项目
a-SiOxNy薄膜化学键结构与缺陷形成机理的研究
期刊论文 15 会议论文 2
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