位置：成果数据库 > 期刊 > 期刊详情页
Structural and optoelectronic properties of ZnO:Al films with various thicknesses deposited by DC pu
  • ISSN号：1842-6573
  • 期刊名称：OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMU
  • 时间：2012.12
  • 页码：960-964
  • 相关项目：a-SiOxNy薄膜化学键结构与缺陷形成机理的研究
作者： Wang, Ying|Jiang, Weiwei|Ding, Wanyu|Wang, Yun|Peng, Shou|Chai, Weiping|
同期刊论文项目
a-SiOxNy薄膜化学键结构与缺陷形成机理的研究
期刊论文 15 会议论文 2
同项目期刊论文
The effect of ion source working power on the composition and optical properties of TiO2 films bomba
Preparation and properties of surface textured ZnO: Al films by direct current pulse magnetron sputt
Formation of linearly linked Fe clusters on Si(111)-7×7-C2H5OH surface
Influence of calcination temperature on the structure, morphology and composition of micro α-Sb2O4 c
An XPS study on the chemical bond structure at the interface between SiOxNy and N doped PET
The effect of growth surface morphology on the crystal structure and magnetic property of L1(0) orde
Study on the growth mechanism of tin-doped indium oxide films deposited by direct current pulse magn
The effect of oxygen ion beam bombardment on the properties of tin indium oxide/polyethylene terepht
氧离子束工作压强对PET表面化学键结构及润湿性能的影响
The nanocrystalline structure of TiO2 film deposited by DC magnetron sputtering at room temperature
薄膜热电偶瞬态温度传感器Al2O3绝缘膜制备工艺及性能表征
薄膜热电偶测温螺钉传感器的研制