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The effect of annealing temperature on resistive switching behaviors of HfOx film
  • ISSN号：0957-4522
  • 期刊名称：Journal of Materials Science: Materials in Electro
  • 时间：2015.9.1
  • 页码：6699-6703
  • 相关项目：HfOx基薄膜微观结构缺陷及其电致电阻转变机制研究
作者： Guo Tingting|Tan Tingting|Liu Zhengtang|
同期刊论文项目
HfOx基薄膜微观结构缺陷及其电致电阻转变机制研究
期刊论文 20
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