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Impacts of Au-doping on the performance of Cu/HfO2/Pt RRAM devices
  • ISSN号：0169-4332
  • 期刊名称：Applied Surface Science
  • 时间：2014.10.30
  • 页码：982-985
  • 相关项目：HfOx基薄膜微观结构缺陷及其电致电阻转变机制研究
作者： Guo Tingting|Chen Xi|Li Xiaojing|Liu Zhengtang|
同期刊论文项目
HfOx基薄膜微观结构缺陷及其电致电阻转变机制研究
期刊论文 20
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