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中文摘要：
搭建了毫米级非均匀粗糙表面红外发射率的等温测量装置，导出了基于热电偶与红外热像仪双重测温技术的红外发射率计算公式。在验证实验测量可靠性的基础上，以典型电子组件PCB板为例，测量获得了该板毫米级粗糙表面不同区域的红外发射率分布，分析测量结果的不确定度为2．11％。研究表明，该测量方法应用方便、结果可靠。
英文摘要：
An experimental device was built to isothermally measure the infrared emissivity of a surface with non-uniform millimeter-scale roughness. The surface temperature are measured by the thermocouples and a thermal imager, respectively. And the emissivity formula for applying the dual temperature measurement data was deduced. After validating the reliability of the experiment, a typical PCB with the non-uniform millimeter-scale rough surface was measured to obtain the infrared emissivity distribution with a measuring uncertainty of 2.11%. The investigation shows that the measuring method is convenient and reliable.
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