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等离子喷涂Ag／（Sn0.8La0.2）O2涂层的组织及电性能
  • ISSN号：0412-1961
  • 期刊名称：《金属学报》
  • 时间：0
  • 分类：TM201[电气工程—电工理论与新技术;一般工业技术—材料科学与工程] TG146.3[金属学及工艺—金属材料;一般工业技术—材料科学与工程;金属学及工艺—金属学]
  • 作者机构：[1]西安工程大学机电工程学院,西安710048, [2]西安交通大学金属材料强度国家重点实验室,西安710049
  • 相关基金：国家自然科学基金重点项目50834003,陕西省教育厅专项科研计划项目11JK0808和西安工程大学博士启动基金项目BS1108资助
作者： 付翀[1], 王俊勃[1], 杨敏鸽[1], 侯锦丽[1], 丁秉钧[2]
关键词： 等离子喷涂, AG, (Sn0, 8La0, 2)O2, 触头合金, 耐电压强度, 电弧侵蚀, plasma spraying, Ag/（Sno.sLao.2）O2, contact material, breakdown strength, arc erosion
中文摘要：

采用等离子喷涂技术在纯Cu表面制备了Ag／（Sn0.8La0.2）O2涂层，利用XRD和SEM对涂层的相结构和微观匀织进行了分析，用拉伸法测定了涂层与基体的结合强度，通过电弧侵蚀实验测试了涂层的耐电压强度以及耐电弧侵蚀性能．结果岽明，所得涂层结构均匀致密，与基体结合强度为18．8MPa，涂层内纳米级（Sn0.8La0.2）O2颗粒均匀分布在Ag基体中；涂层自耐电压强度以及电弧烧蚀速率与块体合金接近，分别为3．76×10^7V／m和37．7μg／C；电弧侵蚀实验后，涂层表面阴极斑点乡散，烧蚀轻微，其电弧侵蚀机制有从液态喷溅向蒸发侵蚀转变的趋势．

英文摘要：

As a pollution-free contact material, Ag/SnO2 has shown a promising prospect to replace noxious Ag/CdO because of its remarkable resistance to arc-erosion and welding. Especially La-doped Ag/SnO2 contact alloy shows excellent electrical properties during arcing test. In this paper, Ag/（Sn0.8La0.2）O2 coating on the Cu substratc was prepared by atmospheric plasma spraying. The phase structure and microstructure of Ag/（Sn0.8La0.2）O2 coating were characterized using XRD and SEM, respectively. The tests of tensile and arc erosion were employed to evaluate bonding strength and electrical properties of coating. The results show that the prepared coating has the uniform dense microstructure. The nanosized （Sn0.8La0.2）O2 particles are uniformly dispersed within the Ag matrix of coating. The bonding strength is 18.8 MPa. The breakdown strength and arc erosion rate of coating are 3.76×10^7 V/m and 37.7 μg/C, and the value are close to the bulk material. After arcing test, the surface of coating presents the dispersion of cathode spots and a little erosion, and the arc erosion mechanism of Ag/（Sn0.8La0.2）O2 coating has a change tendency from liquid splash to evaporation erosion.

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期刊信息
  • 《金属学报》
  • 中国科技核心期刊
  • 主管单位:中国科学协术协会
  • 主办单位:中国金属学会
  • 主编：柯俊
  • 地址：沈阳文化路72号
  • 邮编：110016
  • 邮箱：shxiao@imr.ac.cn
  • 电话：024-23971286
  • 国际标准刊号：ISSN：0412-1961
  • 国内统一刊号：ISSN：21-1139/TG
  • 邮发代号:2-361
  • 获奖情况:
  • 第一、二届全国优秀科技期刊评比一等奖,第一、二、三届国家期刊奖,国家期刊方阵"双高"期刊,第一、二、三届中国科学院科技期刊评比一等奖,中国科学院优秀期刊特别奖,第一、二、三、五届中国科协优秀科技期刊评比一等奖,中国科协精品期刊工程A类、B类,第一、二、三、四、五届中国百种杰出学术期刊,首届出版政府奖
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  • 被引量:26785