中文摘要：

Charging is one of the most important reliability issues in radio frequency microelectro-mechanical systems(RF MEMS) capacitive switches since it makes the actuation voltage unstable.This paper proposes a hybrid model to describe the transient dielectric charging and discharging process in the defect-rich amorphous SiO 2 RF MEMS capacitive switches and verifies experimentally.The hybrid model contains two parts according to two different charging mechanisms of the amorphous SiO 2,which are the polarisation and charge injection.The models for polarisation and for charge injection are established,respectively.Analysis and experimental results show that polarisation is always effective,while the charge injection has a threshold electric field to the amorphous SiO 2 film.Under different control voltage conditions,the hybrid model can accurately describe the experimental data.

英文摘要：

Charging is one of the most important reliability issues in radio frequency microelectro- mechanical systems （RF MEMS） capacitive switches since it makes the actuation voltage unstable. This paper proposes a hybrid model to describe the transient dielectric charging and discharging process in the defect-rich amorphous SiO2 RF MEMS capacitive switches and verifies experimentally. The hybrid model contains two parts according to two different charging mechanisms of the amorphous SiO2, which are the polarisation and charge injection. The models for polarisation and for charge injection are established, respectively. Analysis and experimental results show that polarisation is always effective, while the charge injection has a threshold electric field to the amorphous SiO2 film. Under different control voltage conditions, the hybrid model can accurately describe the experimental data.