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Investigation of electrically induced migration of copper on graphene surfaces: Theory and experimen
  • ISSN号：0003-6951
  • 期刊名称：Applied Physics Letters
  • 时间：2013.8.12
  • 页码：-
  • 相关项目：基于硅基一维纳米线的Gate-all-around纳米晶体管的研究
作者： Wang, Tao|Yu, Bin|Liu, Yan|Deen, M. Jamal|
同期刊论文项目
基于硅基一维纳米线的Gate-all-around纳米晶体管的研究
期刊论文 25 会议论文 6
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