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基于DPCM-Huffman压缩算法的图像传感器去暗电流系统
  • ISSN号：1004-373X
  • 期刊名称：现代电子技术
  • 时间：0
  • 页码：67-70
  • 分类：TN492-34[电子电信—微电子学与固体电子学]
  • 作者机构：[1]天津大学电子信息工程学院,天津300072
  • 相关基金：国家自然科学基金资助项目（60976030,61036004）
  • 相关项目：90-65纳米工艺下数字智能像素CMOS图像传感器研究
作者： 钟晨峰|李斌桥|徐江涛|
关键词： DPCM, HUFFMAN, 暗电流消除, 数据压缩, DPCM, Huffman, dark current elimination, data compression
中文摘要：

为了解决图像传感器暗电流消除过程中数据存储问题,本文提出了一种基于DPCM-Huffman压缩算法的数据压缩去暗电流系统并进行硬件实现;在该系统工作之前,首先通过DPCM与Huffman组合压缩算法将图像传感器暗电流数据进行编码压缩,并将压缩后的数据存储于FLASH存储器中。而后在图像传感器工作过程中,通过读取存储器中数据,进行Huffman与DPCM解码,最终消除图像传感器中的暗电流。实验证明,采用该压缩去暗电流系统处理后,以分辨率为256×256的CMOS图像传感器为例,压缩后数据压缩比为3.12,数据量降为原始数据的32%,提高3倍的工作速度。实践证明,本文提出的解压系统提高了数据压缩比,保证了数据精度,提高了图像传感器的工作速度,是一种适用于CMOS图像传感器暗电流消除的压缩系统。

英文摘要：

To reliably realize the data storage during the dark current elimination of image sensor,a data compression dark current elimination system which based on the DPCM-Huffman compression algorithm is presented in this paper.It is realized by hardware.Before the system works,the coding compression of the image sensor dark current data is executed with DPCM and Huffman compression algorithm,and then the compressed data is stored in the Flash memory.In the working process of the image sensor,the data in the reader-writer memory is used to carry out Huffman and DPCM decoding to eliminate the dark current in image sensors.The experiment proves that,after the processing by the dark current compression elimination system,taking the CMOS image senor whose revolution is 256×256 as an example,the system＇s data compression ratio is 3.12,the quantity of data is decreased by a factor of about 1/3,and the work speed is raised 3 times.Therefore,the decompression system proposed in this paper improved the data compression ratio,ensured the data accuracy and improved the working speed of the image sensor.It is applied to eliminating the CMOS dark current.

同期刊论文项目
90纳米以下高性能CMOS图像传感器关键技术研究
期刊论文 82 会议论文 12 专利 33
90-65纳米工艺下数字智能像素CMOS图像传感器研究
期刊论文 26 会议论文 1
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期刊信息
  • 《现代电子技术》
  • 北大核心期刊（2014版）
  • 主管单位:陕西省信息产业厅
  • 主办单位:陕西电子杂志社 陕西省电子技术研究所
  • 主编：张郁（执行）
  • 地址：西安市金花北路176号陕西省电子技术研究所科研生产大楼六层
  • 邮编：710032
  • 邮箱：met@xddz.com.cn
  • 电话：029-93228979
  • 国际标准刊号：ISSN：1004-373X
  • 国内统一刊号：ISSN：61-1224/TN
  • 邮发代号:52-126
  • 获奖情况:
  • 中国科技核心期刊
  • 国内外数据库收录:
  • 波兰哥白尼索引,中国中国科技核心期刊,中国北大核心期刊（2014版）
  • 被引量:37245