该文构造了热传导型半导体器件的全离散特征有限体积元格式,将特征线方法与有限体积元方法相结合,采用Lagrange型分片二次多项式空间和分片常数函数空间分别作为试探函数和检验函数空间,并进行误差分析,得到了最优阶H^1模误差估计结果.
A fully discrete quadratic finite volume element method along characteristics for the semiconductor device of heat conduction is given, which is used by piecewise lagrange quadratic trial function and piecewise constant test function. Under general conditions, an optimal H^1 error estimate is obtained.