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中文摘要：
FPGA市场已经进入极速发展时代，不同的销售商已向市场投入更多更快的FPGA器件。随着FPGA器件的迅速发展，FP-GA的密度和复杂程度也越来越高，使大量的故障难以使用传统方法进行测试，因此，对FPGA器件的故障测试和故障诊断方法进行更全面的研究具有重要意义。为此重点研究了动态重构FPGA及其基本结构、特点；在此基础上探讨了基于BIST技术的FPGA时延故障测试方法，并成功应用于Lattice ORCA 2C系列FPGA中。实验证明，该BIST方法是可行且有效的，并且不需要昂贵的ATE设备。
英文摘要：
The FPGA market has evolved at an extremely rapid pace with larger and faster devices being released to the industry by different vendors. With the fast expand of FPGA devices, the structure of FPGA becomes more complex, a large number of faults is difficult to use traditional methods for testing, Therefore, the FPGA device fault testing and fault diagnosis method for a more comprehensive study is of great significance. This paper presents a basic structure and feature of currently available dynamically reconfigurable FPGA devices. We present the BIST--Based delay--fault testing approach for FPGAs. We have successfully implemented this BIST approach on the ORCA 2C series FPGA. Our approach is based on B/ST, is comprehensive, and does not require expensive ATE.
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