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Diffraction wavefront analysis of point diffraction interferometer for measurement of aspherical sur
  • 所属机构名称：西安交通大学
  • 会议名称：5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test
  • 时间：2010.10.10
  • 成果类型：会议
  • 相关项目：纳米制造中的计量溯源与测试理论研究
作者： Gao Fen, Jiang Zhuang-de,Li Bing|
同会议论文项目
纳米制造中的计量溯源与测试理论研究
期刊论文 90 会议论文 38 著作 1
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