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Impact of pulse quenching effect on soft error vulnerabilities in combinational circuits based on st
  • ISSN号：0026-2692
  • 期刊名称：Microelectronics Journal
  • 时间：2013.2.2
  • 页码：65-71
  • 相关项目：纳米级集成电路SET软错误率分析技术研究
作者： Du Yankang|Chen Shuming|Liu Biwei|
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纳米级集成电路SET软错误率分析技术研究
期刊论文 32 会议论文 3 专利 12
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